The Industry Council White Paper 3, Part 3 (published by JEDEC as JEP164) has discussed the industry practice to apply IEC 61000-4-2 pulses to pins of a system port. While this practice is widely used, there is neither a standard test procedure nor a common understanding of the robustness levels. This survey should help to collect the approaches in industry and to consolidate them. It will provide the base for a White Paper recommending an industry standard procedure.
Call To Action! Please Click on this Link to take the Survey Now!
The newly coined term "System level direct PIN ESD (SL-DPE)" testing describes a modification of the IEC 61000-4-2 test standard or test methods that are derived from the standard applied to system port pins. While not directly supported by IEC 61000-4-2 the direct pin stress testing is often used to stress:
A schematic view of a system level direct pin ESD stress testing is provided in Figure 1.
A few examples of real world concerns of ESD discharge to port interfaces are shown in Figures 2-4.