Two White Papers on CDM and System ESD Testing updated
Last Updated on Friday, May 14, 2021 01:44
White Paper 3 Part III (WP3P3) on System ESD testing with IEC61000-4-2 has been updated.
WP3P3 proposes a consistent and standardized contact discharge test for System Efficient ESD Design (SEED) and also addresses the many industry difficulties and shortcomings with air discharge testing.
White Paper 2 (WP2) on CDM Target Levels has also been updated to address the realities of optimizing CDM levels for safe manufacturing within the constraints of very high speed serial interfaces and 2.5D and 3D processes in 7nm and beyond.